Orientational dependence of the IR absorbing amide bands of silk is demonstrated from two orthogonal longitudinal and transverse microtome slices with a thickness of only ∼100 nm. Scanning near-field optical microscopy (SNOM) which preferentially probes orientation perpendicular to the sample’s surface was used. Spatial resolution of the silk−epoxy boundary was ͬ... https://www.thegreensjunglebeautyshops.shop/product-category/collections/
Collections
Internet 2 hours 41 minutes ago nkgzzbcrp1wjoWeb Directory Categories
Web Directory Search
New Site Listings